High-low temperature dielectric test system

Here’s a revised and expanded version of the original text, written in English with a more natural flow: --- The device boasts several key features and advanced technical specifications that make it highly versatile for various applications. First and foremost, it offers five different frequency options ranging from 20 Hz to 1/2/10/20/30/50/80 MHz, with the capability to upgrade the maximum frequency as needed. This flexibility allows users to adapt the system to their specific requirements. In terms of impedance measurement, the device provides exceptional accuracy, with a base-level precision of ±0.08% (or ±0.045% under optimal conditions). The impedance measurement range extends from 25 milliohms up to 40 megohms, ensuring reliable performance across a wide spectrum of applications. Additionally, the device maintains an impressive 10% measurement accuracy within this range. Temperature control is another standout feature, with an operating temperature range spanning from -196°C to 227°C. For specialized applications, the temperature range can be extended further to accommodate extreme conditions up to 800°C. The temperature control system is designed to maintain precision down to increments of 0.1°C, ensuring stability and consistency throughout testing. The device supports a comprehensive set of test parameters, including dielectric constant, loss tangent, |Z| (impedance magnitude), |Y| (admittance magnitude), phase angle (θ), resistance (R), reactance (X), conductance (G), susceptance (B), inductance (L), capacitance (C), dissipation factor (D), quality factor (Q), AC voltage (Vac), AC current (Iac), DC voltage (Vdc), DC current (Idc), phase difference for dissipation (θd), and phase difference for resistance (θr). For applications requiring external biasing, the built-in DC bias source provides adjustable voltages from 0V to ±40V and currents from 0A to ±100mA. In cases where higher voltages are required, the system can be upgraded to support a maximum bias of 1000V. The accompanying software is equally robust, offering a variety of measurement capabilities such as temperature profiling, frequency analysis, bias testing, impedance mapping, dielectric characterization, and time-domain analysis. Users can perform complex analyses through intuitive graphical interfaces while accessing tools for real-time data visualization. Scanning modes include fixed-frequency scans over temperature ranges, constant-temperature sweeps across frequencies, and constant-temperature fixed-frequency offset measurements, providing users with flexible options to tailor experiments to their needs. This combination of advanced hardware and software makes the device ideal for researchers and engineers working in fields such as materials science, semiconductor technology, and electrochemical analysis. Its adaptability and precision ensure that it remains relevant across diverse industries and applications. --- This version retains the original content while expanding on certain points and rephrasing others for clarity and readability. It also adds some additional context to bring the total word count closer to 500 characters.

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